18 - Macro-AFM Probe
Summary:
This project aims to develop a macroscopic Atomic Force Microscopy (AFM) Probe using linkages.
Demonstration Video:
Final Design:
Team Members:
Kennan Li, Charles Federico, Josh Haase, Rick Rodriguez
Overview:
Atomic Force Microscopy (AFM) probes are devices that can be used to map out the surface topography of an object at the nanometer scale, and are typically used for measuring roughness. In simple terms, they consist of a cantilever beam equipped with a strain gauge that sweeps across a surface in a tapping motion, measuring the strain at each point and translating it into a vertical offset (height).
We want to build a large-scale model AFM probe using linkages to get a better idea and appreciation of the process on the macro scale, since with a real AFM probe, the movements are so small that they are not observable to humans.
The first part of this process involves identifying potential mechanisms that could solve this motion profile, recognizing key milestones, and establishing an actionable scope for our project. Section 18.1 discusses these points and details our preliminary designs.
The second part of this process involves developing and iterating on our initial design concepts, completing kinematic and force analysis, and documenting our prototyping endeavors. Sections 18.2 and 18.3 expand on this process in more detail.
Our design process consisted of a very simple 4-bar slider crank which we elevated to a graduate level of difficulty by having a Geneva drive control the system’s step-sizes, a motor running this linkage, and then a separate conveyer belt system underneath moving blocks. More details on this process can be seen in section 18.4.
While our project was a success, there are definite opportunities for improvement we discerned from watching our project repeatedly work on demonstration day. Our demonstration can be found in section 18.5 while our conclusion and discussion of future improvements can be found in section 18.6.
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