18 - AFM Probe

This is a project to develop an Atomic Force Microscopy (AFM) Probe using linkages.

Team Members:

Kennan Li, Charles Federico, Josh Haase, Rick Rodriguez

Summary/Overview:

Atomic Force Microscopy (AFM) probes are devices that can be used to map out the surface topography of an object at the nanometer scale, and are typically used for measuring roughness. In simple terms, they consist of a cantilever beam equipped with a strain gauge that sweeps across a surface in a tapping motion and measures the strain recorded at each point, translating that strain into a vertical offset (height).

We want to build a large-scale model AFM probe using linkages to get a better idea and appreciation of the process on the macro scale, since with a real AFM probe, the movements are so small that it is not observable to humans.

The first part of this process involves identifying potential mechanisms that could solve this motion profile, recognizing key milestones, and establishing an actionable scope for our project. Section 18.1 discusses these points and details our preliminary designs.

The second part of this process involves developing and iterating on our initial design concepts, completing kinematic and force analysis, and documenting our prototyping endeavors. Section 18.2 expands on this process in more detail.

Table of Contents: 

• 18.1 - Project Proposal

• 18.2 - Project Prototype