XRD Procedure 2010

XRD Procedure 2010

EMK 5/2010

• Make sure all settings are zero

  • 2thetascan (only moves detector)

    • SS: 0.001

    • TS: 0.1

    • Range: 0.5

  • Peak mode : move to peak

  • User settings : sample offsets : 2theta ‚Äú0‚Äù (set current position to zero)

• Z scan (intersect sample with beam)

  • Set Z ~8.5

    • SS: 2

    • TS: 0.001

    • range: 0.1

  • Set edge where decay is ~1/2 of high intensity

  • Switch to ¬º‚Äù slit (make sure to close the shutter first!)

• Set instrument settings

  • Unit cell for substrate material and (0 0 4) for (h k l)

• Align Omega and Psi

  • Always start and end with omega scan

• After each scan, either use ‚Äòmanual move‚Äô or use ‚Äòpeak mode‚Äô to move line to peak of curve

  • Use log scale for best results

  • If a double curve appears, align consistently to peak of taller curve

  • Should get intensities >100K (1M is best) counts

• Set user data:

  • User setting : change sample offsets to these values (so all plots line up)

• Omega-2theta scan

  • Quick scan to find diffraction pattern

    • SS: 0.004

    • TS: 0.1

    • Range: 7, 8

• Large scan: switch TS to 0.5

  • Should still have peak intensities in ~100K-1M range otherwise there is an alignment issue

  • Saving files:

    • File : convert : PAN & comma separated (2 files)

    • \\lase.mer.utexas.edu\share

    • User: share

    • Psd: