Oxford RIE Logbook

Oxford RIE Logbook

Date User

Sample/Material

Recipe

Etch Time

Etch depth

Notes

Etch Rate

Signed

Date User

Sample/Material

Recipe

Etch Time

Etch depth

Notes

Etch Rate

Signed

2021-08-03

Yinan

Dummy

PECVD SiN @100 C

(amc_sin4) x 15 min

N GaAs 

SJ SiN

150 nm/min

2min 30s

Fully removed

Estimate thickness is about 260 nm

Looks greener than usual SiN grown on 250C for 15 minutes

 

 

2min

Fully removed

 

 

1min 45s

Fully removed 

 

 

1min 30s

Fully removed

 

Wang

2022-01

Dummy

PECVD (new) SiN

ywsin250 x 20min

SJ SiN

150 nm/min

3min

Fully removed

h = 570 nm

 

Wang

40s

130 nm

h = 440 nm;

rate = 130 nm/0.667 min = 195 nm/min

 

Wang

2022-01

Dummy

ywsin100 x 20min

SJ SiN

150 nm/min

4min

Fully removed

h = 710 nm

 

Wang

40s

330 nm

h = 380 nm;

rate = 330 nm/0.667 min = 495 nm/min ?!?!

 

 

 

Dummy

ywsin100 x 8.5min

SJ SiN

150 nm/min

2min

280-300 nm

710/20*8.5 ~= 300 nm, so seems a reasonable result.

 

Wang

2022-03

Dummy

aksio100 x 10min

DK SiO2

30 nm/min

3min

90-100 nm

need to check h0 and h1, but rate is quite accurately 30 nm/min

 

Wang

2022-03

MWIR HOT FPA

SiO2: AKSIO130

x10 min ~ 600 nm 

DK SiO2

30 nm/min

But RF = 300

12 min

Fully removed

The original recipe RF is 200 so make sure to change

50 nm/min

Kamboj